EMI Modeling of Integrated Circuits using pattern simulation

Lionel Courau (1) , Brice Gerbert Gaillard (1)

1 ST-CROLLES - STMicroelectronics [Crolles]

Due to the increasing speed and the low voltage supply of CMOS processes, Integrated Circuits (ICs) are more and more confronted to ElectroMagnetic Compatibility (EMC) problems. Noise emission is propagated through ICs by coupling, routing capacitors and package parasitics. These effects often leads to signal integrity failures, and noise emission level overruns. To study this effect at chip level, from specifications to layout finishing, a new noise simulation has been developped in order to be fast and accurate. Then some comparisons have been made with standard spice simulations showing the efficiency of this flow.

Mots clés: EMC; IC; emission; immunity; susceptibility; modelling; IEC; integrated circuit; electromagnetic compatibility

Domaines: Micro et nanotechnologies/Microélectronique

Lionel Courau, Brice Gerbert Gaillard. EMI Modeling of Integrated Circuits using pattern simulation. 3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits, Nov 2002, Toulouse, France. pp. 116-121. ⟨hal-00526242⟩