Behavioural EMI Models of Complex Digital VLSI Circuits

Thomas Steinecke (1) , H. Kohne (2) , Michael Wi Schmidt (2)

1 Infineon Technologies AG [München]
2 Fraunhofer IZM - Fraunhofer Institute for Reliability and Microintegration

Increasing EMI potential of high-performance digital circuits like 32bit microcontrollers demand for switching current models and feasible ways to run netlist-based EMI simulations. A promising modelling approach for digital VLSI circuits is presented and a silicon test vehicle for correlation between models and measurements is described.

Mots clés: EMC; IC; emission; immunity; susceptibility; modelling; IEC; integrated circuit; electromagnetic compatibility

Domaines: Micro et nanotechnologies/Microélectronique

Thomas Steinecke, H. Kohne, Michael Wi Schmidt. Behavioural EMI Models of Complex Digital VLSI Circuits. 3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits, Nov 2002, Toulouse, France. pp. 110-115. ⟨hal-00526238⟩