Characterization of the influence of different power supply styles on the electromagnetic emission of ICs by using the TEM-Cell method (IEC 61967-2)

T. Ostermann (1) , D. Schneider , C. Bacher , T. Deutschmann , R. Jungreithmair , W. Gut , C. Lackner , R. Kossl , R. Hagelauer

1 RIIC - Research Institute for Integrated Circuits

In the design process of analog and mixed analog-digital circuits some design trade-offs have to be solved. With the use of a special designed test chip this paper will show that the TEM-cell method (IEC standard 61967) could be used as a helpful instrument for these trade-off decisions.

Mots clés: EMC; IC; emission; immunity; susceptibility; modelling; IEC; integrated circuit; electromagnetic compatibility

Domaines: Micro et nanotechnologies/Microélectronique

T. Ostermann, D. Schneider, C. Bacher, T. Deutschmann, R. Jungreithmair, et al.. Characterization of the influence of different power supply styles on the electromagnetic emission of ICs by using the TEM-Cell method (IEC 61967-2). 3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits, Nov 2002, Toulouse, France. pp. 57-60. ⟨hal-00517788⟩