INVESTIGATION ON EMI EFFECTS IN BANDGAP VOLTAGE REFERENCES

Franco Fiori (1) , Paolo Crovetti S. (1)

1 DELEN - Department of Electronics [Torino]

In this paper the susceptibility of integrated bandgap voltage references to Electromagnetic Interference (EMI) is investigated by on-chip measurements carried out on Kuijk and Tsividis bandgap circuits. These measurements highlight the offset in the reference voltage induced by continuous wave (CW) EMI and the complete failures which may be experienced by bandgap circuits. The role of the susceptibility of the startup circuit and of the operational amplifier which are included in such circuits is also focused.

Mots clés: EMC; IC; emission; immunity; susceptibility; modelling; IEC; integrated circuit; electromagnetic compatibility

Domaines: Micro et nanotechnologies/Microélectronique

Franco Fiori, Paolo Crovetti S.. INVESTIGATION ON EMI EFFECTS IN BANDGAP VOLTAGE REFERENCES. 3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits, Nov 2002, Toulouse, France. pp. 35-38. ⟨hal-00517776⟩