Vectorial voltage measurement for ICs on multi-IC PWB

Mart Coenen (1) , Richard Derikx (1)

1 Philips Applied Technologies [Eindhoven]

When a multi-IC PWB fails compliance with the EMC emission requirements it is necessary to locate the IC(s) that can be the cause for this shortcoming. With many applications, too high-induced voltage levels in the ground layer of the PWB are the main cause the RF emission. Many measurement tools do exist to measure the nearfield magnetic field component underneath a PWB. These tools are sensitive enough to locate RF emission areas when measured in the frequency domain but are not fine enough to allocate a certain quadrant of an IC. Most certainly not when the emission is dependent on time i.e. instruction codes being processed. For this purpose, a measurement methodology in the time domain, containing amplitude and phase information has been developed. Uptill recent this has not been feasible by lacking suitable measurement equipment. In this paper a measurement technique is defined in the time domain with sufficient sensitivity and with the capability to be synchronised with the clock frequency or other trigger events generated by the system to be measured.

Mots clés: EMC; IC; emission; immunity; susceptibility; modelling; IEC; integrated circuit; electromagnetic compatibility

Domaines: Micro et nanotechnologies/Microélectronique

Mart Coenen, Richard Derikx. Vectorial voltage measurement for ICs on multi-IC PWB. 3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits, Nov 2002, Toulouse, France. pp. 23-26. ⟨hal-00517754⟩