GTEM cell facility use during project development phases for automotive

Olivier Maurice , Francois de Daran (1) , Rabha Oussedrat , Imad Ben Yacoub

1 VALEO

The purpose is to present results done with GTEM facility during the development phases of project, to measure or to quantify emissions and immunity compliance, regarding integrated circuit influence, for automotive standards. These standards use half anechoic chambers (HAC). Studies have already been done with a comparison between TEM cells and HAC or far field emissions, which showed the limitation of TEM facility to correlate with the results in emission with free space field or HAC. We only want to show the correlation can be good enough to use this facility during a development phase, HAC is often quite overfull and a high price test, how the known of the EMC behavior of the integrated circuit is important to predict the equipment results, and how to use an ICEM model to make prediction regarding emissions.

Mots clés: EMC; IC; emission; immunity; susceptibility; modelling; IEC; integrated circuit; electromagnetic compatibility

Domaines: Micro et nanotechnologies/Microélectronique

Olivier Maurice, Francois de Daran, Rabha Oussedrat, Imad Ben Yacoub. GTEM cell facility use during project development phases for automotive. 3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits, Nov 2002, TOULOUSE, France. pp.19-22. ⟨hal-00517637⟩