Micro force Measurement by an Optical Method

Naceur-Eddine Khélifa (1)

1 LCM - Laboratoire commun de métrologie LNE-CNAM

We discuss the application of stress-induced changes in the crystal of a monolithic Nd:YAG laser as a possibility for microforce measurement. In fact, application of an unknown force on the resonator-amplifier-crystal can lead to a several gigahertz change, depending on the force intensity, of the laser frequency. In addition, the changes rates of the two orthogonally polarizations of the same mode with applied force are different. Hence, the strength of the applied stress can be deduced from measurement of induced change in the beat frequency between the two polarizations or between the fast mode (mode polarized in the orthogonal direction of the stress) and a reference frequency.

Mots clés: micro-force; photoelastic effect; diode laser; beat frequency.; beat frequency

Domaines: Instrumentations et Détecteurs [physics.ins-det]; Micro et nanotechnologies/Microélectronique

Naceur-Eddine Khélifa. Micro force Measurement by an Optical Method. 1st Regional Metrology Organisations Symposium - RMO 2008; 20th International Metrology Symposium, Nov 2008, Dubrovnik, Croatia. pp.CD. ⟨hal-00327718⟩