Scanning Gate Microscopy of a Nanostructure where Electrons Interact

Axel Freyn (1) , Ioannis Kleftogiannis (1, 2) , Jean-Louis Pichard (1)

1 SPEC - UMR3680 - Service de physique de l'état condensé
2 Department of Physics [Ioannina)

We show that scanning gate microscopy can be used for probing electron-electron interactions inside a nanostructure. We assume a simple model made of two non-interacting strips attached to an interacting nanosystem. In one of the strips, the electrostatic potential can be locally varied by a charged tip. This change induces corrections upon the nanosystem Hartree-Fock self-energies which enhance the fringes spaced by half the Fermi wavelength in the images giving the quantum conductance as a function of the tip position.

Mots clés: Theories and models of many-electron systems; Theory of electronic transport; scattering mechanisms; Electronic transport in mesoscopic systems; Electronic transport in nanoscale materials and structures; Scanning probe microscopes and components; SGM

Domaines: Systèmes mésoscopiques et effet Hall quantique [cond-mat.mes-hall]

Axel Freyn, Ioannis Kleftogiannis, Jean-Louis Pichard. Scanning Gate Microscopy of a Nanostructure where Electrons Interact. Physical Review Letters, 2008, 100, pp.226802-1. ⟨10.1103/PhysRevLett.100.226802⟩. ⟨hal-00218234v2⟩