An Approach to The Electrical Characterization of Analog Blocks through Thermal Measurements

D. Mateo (1) , J. Altet (1) , E. Aldrete-Vidrio (1)

1 EEL - Electronic Engineering Department [Barcelona]

In this work the authors analyse the effects of the electrical performances of analogue circuits, specifically amplifiers, on the silicon surface thermal map. The goal of this analysis is to explore the feasibility of obtaining the figures of merit of analogue blocks from temperature measurements.

Mots clés: Thermal characterization; thermal testing; electrical characterization

Domaines: Architectures Matérielles [cs.AR]

D. Mateo, J. Altet, E. Aldrete-Vidrio. An Approach to The Electrical Characterization of Analog Blocks through Thermal Measurements. THERMINIC 2005, Sep 2005, Belgirate, Lago Maggiore, Italy. pp.59-64. ⟨hal-00189454⟩