Defect Aware Test Patterns

Huaxing Tang (1) , Gang Chen (1) , Sudhakar M. Reddy (1) , Chen Wang (2) , Janusz Rajski (2) , Irith Pomeranz (3)

1 ECE Dept.
2 Mentor Graphic Corporation
3 ECE - School of Electrical and Computer Engineering [West Lafayette]

A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns have greater ability to detect un-modeled defects. The proposed method can be used with any test generation procedure to improve the effectiveness of the tests in detecting un-modeled defects. Experimental results on several industrial designs show the effectiveness of defect aware tests. We also propose a measure to estimate the effectiveness of given test sets in detecting un-modeled defects.

Domaines: Architectures Matérielles [cs.AR]; Electronique

Huaxing Tang, Gang Chen, Sudhakar M. Reddy, Chen Wang, Janusz Rajski, et al.. Defect Aware Test Patterns. DATE'05, Mar 2005, Munich, Germany. pp.450-455. ⟨hal-00181648⟩