Worst-Case and Average-Case Analysis of n-Detection Test Sets

Irith Pomeranz (1) , Sudhakar M. Reddy (2)

1 ECE - School of Electrical and Computer Engineering [West Lafayette]
2 Electrical and Computer Eng. Dept.

Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform both a worst-case analysis and an average-case analysis to check the effect of restricting n on the unmodeled fault coverage of an (arbitrary) n-detection test set. Our analysis is independent of any particular test set or test generation approach. It is based on a specific set of target faults and a specific set of untargeted faults. It shows that, depending on the circuit, very large values of n may be needed to guarantee the detection of all the untargeted faults. We discuss the implications of these results.

Domaines: Architectures Matérielles [cs.AR]; Electronique

Irith Pomeranz, Sudhakar M. Reddy. Worst-Case and Average-Case Analysis of n-Detection Test Sets. DATE'05, Mar 2005, Munich, Germany. pp.444-449. ⟨hal-00181554⟩