Reliability-Centric High-Level Synthesis

S. Tosun (1) , N. Mansouri (1) , E. Arvas (1) , M. Kandemir (2) , Yuan Xie (2)

1 ECS
2 CSE

Importance of addressing soft errors in both safety critical applications and commercial consumer products is increasing, mainly due to ever shrinking geometries, higher-density circuits, and employment of power-saving techniques such as voltage scaling and component shut-down. As a result, it is becoming necessary to treat reliability as a first-class citizen in system design. In particular, reliability decisions taken early in system design can have significant benefits in terms of design quality. Motivated by this observation, this paper presents a reliability-centric high-level synthesis approach that addresses the soft error problem. The proposed approach tries to maximize reliability of the design while observing the bounds on area and performance, and makes use of our reliability characterization of hardware components such as adders and multipliers. We implemented the proposed approach, performed experiments with several designs, and compared the results with those obtained by a prior proposal.

Domaines: Architectures Matérielles [cs.AR]; Electronique

S. Tosun, N. Mansouri, E. Arvas, M. Kandemir, Yuan Xie. Reliability-Centric High-Level Synthesis. DATE'05, Mar 2005, Munich, Germany. pp.1258-1263. ⟨hal-00181301⟩