Generalization of the ideal crack model in eddy-current testing

Philippe Beltrame (1) , Noël Burais (1, 2)

1 CEGELY - Centre de génie électrique de Lyon
2 AMPERE - Ampère

In the ideal crack model in eddy-current testing frame, the field-flaw is equivalent to a current dipole layer on its surface. This model has shown its efficiency, as well for the computing accuracy, as for the CPU time. The goal of this paper is to improve this model taking into account the inclination, the conductance, and the low thickness of the crack.

Mots clés: eddy-current testing; integral equations; modelization; thin crack

Domaines: Modélisation et simulation; Electromagnétisme; Autre

Philippe Beltrame, Noël Burais. Generalization of the ideal crack model in eddy-current testing. IEEE Transactions on Magnetics, 2004, 40 (2 Part 2), pp.1366-1369. ⟨10.1109/TMAG.2004.825433⟩. ⟨hal-00140338⟩