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| HAL : hal-00079373, version 1 |
| DOI : 10.1016/j.mejo.2005.04.062 |
| Fiche détaillée |  Récupérer au format |
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| Microelectronics Journal Vol.36, No.12 (2005) 1080-1090 |
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| A low-cost digital frequency testing approach for mixed-signal devices using ΣΔ modulation |
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| G. Prenat 1S. Mir 1 |
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| (2005) |
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| This paper presents a digital approach to frequency testing of Analogue and mixed-signal (AMS) circuits. This approach is aimed at facilitating low-cost test techniques for system-on-chip (SoC) devices, rendering the test of mixed-signal cores compatible with the use of a low-cost digital tester. Analogue test signal generation is performed on-chip by low pass filtering a sigma–delta (ΣΔ) encoded bit-stream. Analogue harmonic test response analysis is also performed on-chip using square wave modulation and ΣΔ modulation. Since both analogue signal generation and test response analysis are digitally programmable on-chip, compatibility with a low-cost digital tester is ensured. Optimisation of test signatures is discussed in detail as a trade-off between fault and yield coverage. A 0.18 μm CMOS implementation of this BIST technique is presented, including some experimental results. |
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| 1 : | Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA) |
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CNRS : UMR5159 – Université Joseph Fourier - Grenoble I – Institut National Polytechnique de Grenoble (INPG) |
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| 2 : | Instituto de Microelectrónica de Sevilla (CNM) |
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Centro Nacional de Microelectronica |
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| Domaine | : | Sciences de l'ingénieur/Micro et nanotechnologies/Microélectronique |
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| Analogue and mixed-signal – system-on-chip |
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| hal-00079373, version 1 | |
| http://hal.archives-ouvertes.fr/hal-00079373 | |
| oai:hal.archives-ouvertes.fr:hal-00079373 | |
| Contributeur : Lucie Torella | |
| Soumis le : Lundi 12 Juin 2006, 15:10:40 | |
| Dernière modification le : Lundi 12 Juin 2006, 15:10:40 | |
