1. Recherche
26 résultats  enregistrer la recherche
hal-01237003v1  Communication dans un congrès
Saleh Eddine Ben Jbara, Pierre David, Gülgün Alpan. A Modeling Framework Based on SCOR Model Towards Supply Chain Risk Management
45th International Conference on Computers & Industrial Engineering CIE45, Oct 2015, Metz, France. CIE45 Proceedings
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hal-00579882v1  Communication dans un congrès
Belgacem Bettayeb, Samuel Bassetto, Michel Tollenaere. Optimized design of control plans based on risk exposure and resources capabilities
Semiconductor Portal, Inc. International Symposium on Semiconductor Manufacturing, Oct 2010, Tokyo, Japan. pp.267-270, 2010
hal-00188443v1  Communication dans un congrès
Gonca Tuncel, Gülgün Alpan. A High-level Petri Net Based Modeling Approach for Risk Management in Supply Chain Networks
EUROSIS-ETI Publication. 21st European Simulation and Modeling Conference - ESM 2007, Oct 2007, St.Julians, Malta. pp.178-185, 2007, ISBN: 9789077381366
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hal-00453784v1  Communication dans un congrès
Maud Lemagnen, Fabrice Mathieux, Damien Prunel, Daniel Brissaud. Managing chemical risk during design in aeronautics: from technical product data to exposure assessment
EcoDesign 2009: 6th International Symposium on Environmentally Conscious Design and Inverse Manufacturing, Dec 2009, Sapporo, Japan. pp.GT1-1C-2, 2009
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tel-00587357v1  Thèse
Maud Lemagnen. Intégration du risque chimique dans la conception de produits industriels. Application au secteur de l'aéronautique
Autre. Université Grenoble Alpes, 2011. Français. <NNT : 2010GRENI006>
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hal-00455699v1  Communication dans un congrès
Maud Lemagnen, Fabrice Mathieux, Bertrand Laratte, Daniel Brissaud. Assessment of chemical risk during product life cycle: a new method to be used during product design
16th International CIRP Conference on Life Cycle Engineering, May 2009, Cairo, Egypt. pp.91_98, 2009
hal-01236973v1  Communication dans un congrès
El Abed El Safadi, Olivier Adrot, Jean-Marie Flaus. Advanced Monte Carlo Method for model uncertainty propagation in risk assessment
15th Symposium Information Control Problems in Manufacturing INCOM2015, May 2015, Ottawa, Canada
hal-00346728v1  Communication dans un congrès
Olcay Onder, Fabrice Mathieux, Daniel Brissaud, Serhan Ozdemir. Predicting Product Health: Methods To Support The Design Of Reusable Components
CIRP Design Conference 2008: Design Synthesis, Apr 2008, Twente, Netherlands. 4p., 2008
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hal-00730524v1  Communication dans un congrès
Khalil Negrichi, Maria Di Mascolo, Jean-Marie Flaus. Risk analysis in sterilization services: A first step towards a generic model of risk
GISEH'2012 - 6ème conférence francophone en Gestion et Ingénierie des SystèmEs Hospitaliers, Aug 2012, Québec, Canada. 2012
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hal-01521762v1  Pré-publication, Document de travail
H Abdo, Mohamad Kaouk, Jean-Marie Flaus, François Masse. A new approach that considers cyber security within industrial risk analysis using a cyber bow-tie analysis
2017
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hal-00370221v1  Communication dans un congrès
Maud Lemagnen, Fabrice Mathieux, Daniel Brissaud. How managing more efficiently substances in the design process of industrial products? An example from the aeronautics sector.
2nd International Seminar on Materials and Society, Apr 2008, Nantes, France. 10p., 2008
emse-00538314v1  Communication dans un congrès
Georgios-Marios Karagiannis, Eric Piatyszek, Jean-Marie Flaus. Robustness analysis of industrial emergency plans: a model-based methodology
7th International Conference on Computer Simulation of Risk Analysis and Hazard Mitigation, Sep 2010, Algarve, Portugal. WIT Press, 43, pp.PI-93-104, 2010, WIT Transactions on Information and Communication Technologies. <10.2495/RISK100091>
hal-00685918v1  Communication dans un congrès
M'Hammed Sahnoun, Philippe Vialletelle, Samuel Bassetto, Michel Tollenaere, Soidri Bastoini. Computation of Wafer-At-Risk from Theory to Real Life Demonstration
Manufacturing Challenges in European Semiconductor Fabs, Nov 2010, Rousset, France
hal-00685926v1  Communication dans un congrès
M'Hammed Sahnoun, Belgacem Bettayeb, Samuel Bassetto, Michel Tollenaere. Smart sampling for risk reduction and delay optimisation
2012 IEEE International Systems Conference, Mar 2012, vancouver, Canada. pp.1-6, 2012
hal-00392567v1  Article dans une revue
Jean-Marie Flaus. A model-based approach for systematic risk analysis
J. Risk and Reliability, 2008, 222, pp.79-93
hal-00993729v1  Communication dans un congrès
Khalil Negrichi, Jean-Marie Flaus, Maria Di Mascolo. Conversion of a Risk model into a Petri Net Model for simulation and analysis
European Safety and Reliability Conference ESREL, Sep 2014, Wrocław, Poland
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tel-01224166v1  Thèse
El Abed El Safadi. Contribution à l'évaluation des risques liés au TMD (transport de matières dangereuses) en prenant en compte les incertitudes
Automatique / Robotique. Université Grenoble Alpes, 2015. Français. < NNT : 2015GREAT059 >
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tel-01204774v1  Thèse
Hélène Personnier. La conception collaborative avec les fournisseurs : proposition d'une méthode d'analyse par les dysfonctionnements
Autre. Université de Grenoble, 2013. Français. <NNT : 2013GRENI086>
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tel-01286140v1  Thèse
Khalil Negrichi. Approche intégrée pour l'analyse de risques et l'évaluation des performances : application aux services de stérilisation hospitalière
Autre. Université Grenoble Alpes, 2015. Français. < NNT : 2015GREAI105 >
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tel-01447765v1  Thèse
Hassan Kanj. Contribution to risk analysis related to the transport of hazardous materials by agent-based simulation
Automatic. Université Grenoble Alpes, 2016. English. < NNT : 2016GREAT060 >
hal-01441134v1  Article dans une revue
Khalil Negrichi, Maria Di Mascolo, Jean-Marie Flaus. A model based approach to assess the performance of production systems in degraded mode
International Journal of Production Research, Taylor & Francis, 2016, to appear, DOI: 10.1080/00207543.2016.1237788, pp.1 - 16. <10.1080/00207543.2016.1237788>
hal-00677042v1  Article dans une revue
Belgacem Bettayeb, Samuel Bassetto, Philippe Vialletelle, Michel Tollenaere. Quality and exposure control in semiconductor manufacturing. Part I: Modelling
International Journal of Production Research, Taylor & Francis, 2012, 50 (23), pp.6835-6851. <10.1080/00207543.2011.630042>
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hal-00676970v1  Article dans une revue
M'Hammed Sahnoun, Samuel Bassetto, Michel Tollenaere, Philippe Vialletelle, Soidri Bastoini. Optimisation of the process control in a semiconductor company: model and case study of defectivity sampling
International Journal of Production Research, Taylor & Francis, 2011, Vol. 49 (No. 13), pp.3873-3890. <10.1080/00207543.2010.484429>

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