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tel-00669712v1  Thèse
Georgio Marios KaragiannisMethodologie pour l’analyse de la robustesse des plans de secours industriels
Autre. Ecole Nationale Supérieure des Mines de Saint-Etienne, 2010. Français. <NNT : 2010EMSE0590>
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tel-00804727v1  Thèse
Olivier RoustantProduits dérivés climatiques : aspects économétriques et financiers
Gestion et management. Université Claude Bernard - Lyon I, 2003. Français. <NNT : 2003LYO10111>
emse-00699607v1  Article dans une revue
Olivier RoustantJean-Paul LaurentXavier BayLaurent CarraroModel risk in the pricing of weather derivatives
Bankers Markets & Investors : an academic & professional review, Groupe Banque, 2004, p. 5-16
hal-00699544v1  Communication dans un congrès
Olivier RoustantJ.-P. LaurentXavier BayL. CarraroA bootstrap approach to the pricing of weather derivatives
35 eme colloque ASTIN, Jun 2003, Bergen, Norway. 2003
emse-00538314v1  Communication dans un congrès
Georgios-Marios KaragiannisEric PiatyszekJean-Marie FlausRobustness analysis of industrial emergency plans: a model-based methodology
7th International Conference on Computer Simulation of Risk Analysis and Hazard Mitigation, Sep 2010, Algarve, Portugal. WIT Press, 43, pp.PI-93-104, 2010, WIT Transactions on Information and Communication Technologies. <10.2495/RISK100091>
emse-00679657v1  Communication dans un congrès
Diane VillanuevaRodolphe Le RicheGauthier PicardRaphael T. HafktaA Multi-Agent System Approach to Risk Allocation for Reliability Based Design Optimization
12ème congrès de la société Française de Recherche Opérationnelle et d'Aide à la Décision (ROADEF 2011), Mar 2011, Saint Etienne, France. pp.submission 153, 2011
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tel-00611839v1  Thèse
Van-Hoan VuInfrastructure de gestion de la confiance sur internet
Autre. Ecole Nationale Supérieure des Mines de Saint-Etienne, 2010. Français. <NNT : 2010EMSE0585>
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tel-01126975v1  Thèse
Gloria Luz Rodriguez VerjanSMART SAMPLING FOR RISK REDUCTION IN SEMICONDUCTOR MANUFACTURING
Other. Ecole Nationale Supérieure des Mines de Saint-Etienne, 2014. English. < NNT : 2014EMSE0747 >
emse-01438318v1  Article dans une revue
Areski CousinHassan MaatoukDidier RullièreKriging of financial term-structures
European Journal of Operational Research, Elsevier, 2016, 255 (2), pp.631 - 648. <10.1016/j.ejor.2016.05.057>
emse-00755796v1  Communication dans un congrès
Gloria Luz Rodriguez VerjanStéphane Dauzère-PérèsJacques PinatonA Mathematical Model for Estimating Defectivity Capacity with a Dynamic Control Strategy
Winter Simulation Conference, Dec 2012, Berlin, Germany. pp.1-9, 2012
emse-00722672v1  Communication dans un congrès
Gloria Luz Rodriguez VerjanEric TartiereJacques PinatonStéphane Dauzère-PérèsAlexis ThieullenDispatching of Lots to Dynamically Reduce the Wafers at Risk in Semiconductor Manufacturing
8th IEEE International conference on Automation Science and Engineering, Aug 2012, Seoul, South Korea. pp.1-4, 2012
emse-00605648v1  Communication dans un congrès
Justin Nduhura MungaStéphane Dauzère-PérèsClaude YugmaPhilippe VialletelleA Mathematical Programming Approach for Determining Control Plans in Semiconductor manufacturing
4th International Conference on Industrial Engineering and Systems Management, May 2011, Metz, France. pp.1-9, 2011
emse-00605647v1  Communication dans un congrès
Justin Nduhura MungaStéphane Dauzère-PérèsPhilippe VialletelleClaude YugmaDynamic Management of Controls in Semiconductor Manufacturing
22nd Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC), May 2011, Saratoga, New York, United States. pp.18-23, 2011
emse-00644000v1  Communication dans un congrès
Justin Nduhura-MungaStéphane Dauzère-PérèsClaude YugmaPhilippe VialletelleA Mathematical Programming Approach for Determining Control Plans in Semiconductor Manufacturing
International Conference on Industrial Engineering and Systems Management IESM' 2011, May 2011, Metz, France. pp.2, 2011
emse-01003743v1  Communication dans un congrès
Gloria Luz Rodriguez VerjanStéphane Dauzère-PérèsSylvain HoussemanJacques PinatonSkipping algorithms for defect inspection using a dynamic control strategy in semiconductor manufacturing
MASM 2013 (9th International Conference on Modeling and Analysis of Semiconductor Manufacturing), included in the 2013 Winter Simulation Conference., Dec 2013, Washington, United States. pp.3684 - 3695, 2013
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