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hal-00713076v1  Communication dans un congrès
Mounira BerkaniStéphane LefebvreOthman DhouhaMoumen SabrineZoubir Khatir et al.  Failure modes and robustness of SiC JFET transistors under current limiting operations
Power Electronics and Applications (EPE 2011),, Aug 2011, Birmingham, United Kingdom. pp.1-10, 2011
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hal-00476271v1  Article dans une revue
Ludovic MénagerMaher SoueidanBruno AllardVincent BleyBenoît SchlegelA Lab-Scale Alternative Interconnection Solution of Semiconductor Dice Compatible with Power Modules 3-D Integration
IEEE Transactions on Power Electronics, Institute of Electrical and Electronics Engineers, 2010, 25 (7), pp.1667 - 1670. <10.1109/TPEL.2010.2041557>
hal-00713206v1  Article dans une revue
Vanessa SmetFrançois ForestJean-Jacques HuselsteinFrédéric RichardeauZoubir Khatir et al.  Ageing and Failure Modes of IGBT Modules in High Temperature Power Cycling
IEEE Transactions on Industrial Electronics, Institute of Electrical and Electronics Engineers, 2011, 58 (10), pp.4931 - 4941. <10.1109/TIE.2011.2114313>
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hal-01466116v1  Article dans une revue
Laurent DupontYvan AvenasPreliminary Evaluation of Thermo-Sensitive Electrical Parameters Based on the Forward Voltage for Online Chip Temperature Measurements of IGBT Devices
IEEE Transactions on Industry Applications, Institute of Electrical and Electronics Engineers, 2015, 6 (51), pp.4688-4698. <10.1109/TIA.2015.2458973>