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lirmm-01248587v1  Communication dans un congrès
Lun Yang, Yuanqing Cheng, Yuhao Wang, Hao Yu, Weisheng Zhao et al.  A body-biasing of readout circuit for STT-RAM with improved thermal reliability
ISCAS: International Symposium on Circuits and Systems, May 2015, Lisbon, Portugal. pp.1530-1533, 2015, <10.1109/ISCAS.2015.7168937>
lirmm-01248589v1  Communication dans un congrès
Alessandro Magnani, M. De Magistris, Antonio Maffucci, Aida Todri-Sanial. A node clustering reduction scheme for power grids electrothermal analysis
SPI: Signal and Power Integrity, May 2015, Berlin, Germany. Signal and Power Integrity (SPI), 2015 IEEE 19th Workshop on, pp.1-4, 2015, <10.1109/SaPIW.2015.7237399>
lirmm-01248596v1  Communication dans un congrès
Yuanqing Cheng, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard et al.  Power supply noise-aware workload assignments for homogeneous 3D MPSoCs with thermal consideration
ASP-DAC: Asia and South Pacific Design Automation Conference, Jan 2014, Singapore, Singapore. pp.544-549, 2014, Design Automation Conference (ASP-DAC), 2014 19th Asia and South Pacific. <10.1109/ASPDAC.2014.6742948>
lirmm-01248598v1  Communication dans un congrès
Imran Wali, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard et al.  Protecting combinational logic in pipelined microprocessor cores against transient and permanent faults
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. Design and Diagnostics of Electronic Circuits Systems, 17th International Symposium on, pp.223-225, 2014, <10.1109/DDECS.2014.6868794>
lirmm-01248597v1  Communication dans un congrès
Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial et al.  A Comprehensive Evaluation of Functional Programs for Power-Aware Test
NATW: North Atlantic Test Workshop, May 2014, Johnson City, NY, United States. IEEE, Test Workshop (NATW), 2014 IEEE 23rd North Atlantic, pp.69-72, 2014, <10.1109/NATW.2014.23>
lirmm-01248617v1  Communication dans un congrès
Yuanqing Cheng, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard et al.  A novel method to mitigate TSV electromigration for 3D ICs
ISVLSI: IEEE Computer Society Annual Symposium on VLSI, Aug 2013, Natal, Brazil. pp.121-126, 2013, <10.1109/ISVLSI.2013.6654633>
lirmm-00805140v1  Communication dans un congrès
Leonardo Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial et al.  Test Solution for Data Retention Faults in Low-Power SRAMs
EDA Association. DATE: Design, Automation and Test in Europe, Mar 2013, Grenoble, France. Design, Automation & Test in Europe Conference & Exhibition, pp.442-447, 2013, <http://www.date-conference.com/>. <10.7873/DATE.2013.099>
lirmm-00805143v1  Communication dans un congrès
Leonardo Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial et al.  Low-power SRAMs Power Mode Control Logic: Failure Analysis and Test Solutions
ITC'2012: International Test Conference, Nov 2012, Anaheim, CA, United States. IEEE, pp.1-10, 2012, <http://www.itctestweek.org/>. <10.1109/TEST.2012.6401578>
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tel-01255761v1  HDR
Aida Todri-Sanial. Design Space Exploration Of Emerging Technologies For Energy Efficiency
Digital Libraries [cs.DL]. University of Montpellier, 2014
lirmm-01248593v1  Communication dans un congrès
Xiaolong Zhang, Yuanqing Cheng, Weisheng Zhao, Youguang Zhang, Aida Todri-Sanial. Exploring potentials of perpendicular magnetic anisotropy STT-MRAM for cache design
Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on, 2014, Unknown, Unknown or Invalid Region. pp.1-3, 2014, <10.1109/ICSICT.2014.7021342>
lirmm-00818984v1  Communication dans un congrès
Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel. Why and How Controlling Power Consumption During Test: A Survey
ATS: Asian Test Symposium, Nov 2012, Niigata, Japan. Test Symposium (ATS), 2012 IEEE 21st Asian, pp. 221-226, 2012, <http://aries3a.cse.kyutech.ac.jp/~ats12/>. <10.1109/ATS.2012.30>
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hal-01348476v1  Communication dans un congrès
Nicolas Jeanniot, Aida Todri-Sanial, Pascal Nouet, Gaël Pillonnet, Hervé Fanet. Investigation of the power-clock network impact on adiabatic logic
SPI: Signal and Power Integrity, May 2016, Turin, Italy. 2016 IEEE 20th Workshop on Signal and Power Integrity (SPI) pp.1-4, 2016, <http://www.spi2016.org/>. <10.1109/SaPIW.2016.7496270>
lirmm-01248628v1  Communication dans un congrès
Aida Todri-Sanial, Malgorzata Marek-Sadowska, François Maire, Christophe Matheron. A study of decoupling capacitor effectiveness in power and ground grid networks
ISQED: International Symposium on Quality Electronic Design, Mar 2009, San Jose, CA, United States. 10th International Symposium on Quality Electronic Design, pp.653-658, 2009, <10.1109/ISQED.2009.4810371>
lirmm-01248590v1  Communication dans un congrès
Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri-Sanial, Arnaud Virazel et al.  Test and diagnosis of power switches
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. Design and Diagnostics of Electronic Circuits Systems, 17th International Symposium on, pp.213-218, 2014, <10.1109/DDECS.2014.6868792>
lirmm-00805123v1  Communication dans un congrès
Leonardo Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch et al.  Failure Analysis and Test Solutions for Low-Power SRAMs
ATS: Asian Test Symposium, Nov 2011, New Delhi, India. 20th IEEE Asian Test Symposium, pp.459-460, 2011, <http://www.ecs.umass.edu/ece/ats11/>. <10.1109/ATS.2011.97>
lirmm-00805366v1  Communication dans un congrès
Leonardo Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial et al.  A Built-in Scheme for Testing and Repairing Voltage Regulators of Low-Power SRAMs
VTS: VLSI Test Symposium, Apr 2013, Berkeley, CA, United States. pp.1-6, 2013, VLSI Test Symposium (VTS), 2013 IEEE 31st. <http://www.tttc-vts.org/public_html/new/2013/index.php>. <10.1109/VTS.2013.6548894>
lirmm-00805374v1  Communication dans un congrès
Leonardo Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial et al.  Defect Analysis in Power Mode Control Logic of Low-Power SRAMs
ETS: European Test symposium, May 2012, Annecy, France. 17th IEEE European Test Symposium, 2012, <http://ets2012.imag.fr/>. <10.1109/ETS.2012.6233033>
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lirmm-01446275v1  Communication dans un congrès
Liuyang Zhang, Aida Todri-Sanial, Wang Kang, Youguang Zhang, Lionel Torres et al.  Quantitative evaluation of reliability and performance for STT-MRAM
ISCAS: International Symposium on Circuits and Systems, May 2016, Montréal, QC, Canada. IEEE, http://iscas2016.org, pp.1150-1153, 2016, <http://iscas2016.org>. <10.1109/ISCAS.2016.7527449>
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lirmm-01446182v1  Communication dans un congrès
Ghizlane Mouslih, Aida Todri-Sanial, Pascal Nouet. On Analysis of On-chip DC-DC Converters for Power Delivery Networks
ISVLSI: IEEE Computer Society Annual Symposium on VLSI, Jul 2015, Montpellier, France. IEEE, IEEE Computer Society Annual Symposium on VLSI (ISVLSI), pp.557-560, 2015, <10.1109/ISVLSI.2015.96>
lirmm-01248599v1  Communication dans un congrès
Anu Asokan, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard et al.  Path delay test in the presence of multi-aggressor crosstalk, power supply noise and ground bounce
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. IEEE, Design and Diagnostics of Electronic Circuits & Systems, 17th International Symposium on, pp.207-212, 2014, <10.1109/DDECS.2014.6868791>
lirmm-01248601v1  Communication dans un congrès
Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri-Sanial, Arnaud Virazel et al.  iBoX — Jitter based Power Supply Noise sensor
ETS: European Test Symposium, May 2014, Paderborn, United States. Test Symposium (ETS), 2014 19th IEEE European, pp.1-2, 2014, <10.1109/ETS.2014.6847830>
lirmm-01248586v1  Communication dans un congrès
Bi Wu, Yuanqing Cheng, Ying Wang, Aida Todri-Sanial, Guangyu Sun et al.  An architecture-level cache simulation framework supporting advanced PMA STT-MRAM
NANOARCH: Nanoscale Architectures, Jun 2015, Boston, MA, United States. Nanoscale Architectures (NANOARCH), 2015 IEEE/ACM International Symposium on, pp.7-12, 2015, <10.1109/NANOARCH.2015.7180576>
lirmm-01445865v1  Article dans une revue
Alessandro Magnani, Massimiliano De Magistris, Aida Todri-Sanial, Antonio Maffucci. Electrothermal Analysis of Carbon Nanotubes Power Delivery Networks for Nanoscale Integrated Circuits
IEEE Transactions on Nanotechnology, Institute of Electrical and Electronics Engineers, 2016, 15 (3), pp.380-388. <10.1109/TNANO.2016.2535390>
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lirmm-00806774v1  Article dans une revue
Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel. Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2013, 21 (5), pp.958-970. <10.1109/TVLSI.2012.2197427>
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lirmm-01446137v1  Article dans une revue
Aida Todri-Sanial, Yuanqing Cheng. A Study of 3-D Power Delivery Networks With Multiple Clock Domains
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2016, 24 (11), pp.3218-3231. <10.1109/TVLSI.2016.2549275>
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lirmm-01255754v1  Article dans une revue
Aida Todri-Sanial, Sandip Kundu, Patrick Girard, Alberto Bosio, Luigi Dilillo et al.  Globally Constrained Locally Optimized 3-D Power Delivery Networks
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2014, 22 (10), pp.2131-2144. <10.1109/TVLSI.2013.2283800>
lirmm-01255756v1  Article dans une revue
Aida Todri-Sanial, Sanjukta Bhanja. Special Issue on Advances in Design of Ultra-Low Power Circuits and Systems in Emerging Technologies
ACM Journal on Emerging Technologies in Computing Systems, Association for Computing Machinery, 2015, Guest Editorial, 12 (2), pp.#11. <10.1145/2756554>

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