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hal-00747409v1  Article dans une revue
H. MejbriKaiçar AmmousHervé MorelAnis AmmousOptimal design of power converter using multi-objective genetic algorithm
International Review on Modelling and Simulations, 2012, 5 (2), pp.793-802
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hal-00413349v1  Communication dans un congrès
Cyril ButtayDominique PlansonBruno AllardDominique BergognePascal Bevilacqua et al.  State of the art of High Temperature Power Electronics
Microtherm, Jun 2009, Lodz, Poland. pp.8-17, 2009
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hal-01372146v1  Communication dans un congrès
Bruno AllardCyril ButtayCéline MartinHervé MorelConsiderations for High Temperature Power Electronics
18th International Symposium on Power Electronics Ee2015, Oct 2015, Novi Sad, Serbia
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hal-00799884v1  Article dans une revue
Rémy OuaidaCyril ButtayAnh Dung HoangRaphaël RivaDominique Bergogne et al.  Thermal Runaway Robustness of SiC VJFETs
Materials Science Forum, Trans Tech Publications Inc., 2013, 740-742, pp.929-933. <10.4028/www.scientific.net/MSF.740-742.929>
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hal-00687139v1  Communication dans un congrès
Bruno AllardCyril ButtayDominique TournierRémi RobutelJean-François Mogniotte et al.  Higher temperature power electronics for larger-scale mechatronic integration
Automotive Power Electronics, Apr 2011, Paris, France. Actes sur CD (pas de pagination), 2011
hal-00140112v1  Article dans une revue
Anis AmmousFayçal SellamiKaiçar AmmousHervé MorelBruno Allard et al.  Developing an equivalent thermal model for discrete semiconductor packages
International Journal of Thermal Sciences, Elsevier, 2003, 42 (5), pp.533-539
hal-00391376v1  Communication dans un congrès
Dominique TournierPascal BevilacquaDominique PlansonHervé MorelPierre Brosselard et al.  High Power Density SiC 450A AccuMOSFET for Current Limiting Applications
ECSCRM, Sep 2008, Barcelona, Spain. TRANS TECH PUBLICATIONS LTD, LAUBLSRUTISTR 24, CH-8717 STAFA-ZURICH, SWITZERLAND, 615-617, pp.911-914, 2009, <10.4028/www.scientific.net/MSF.615-617.911>
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hal-00672602v1  Communication dans un congrès
Amandine MassonCyril ButtayHervé MorelChristophe RaynaudStanislas Hascoët et al.  High-temperature die-attaches for SiC power devices
EPE, Aug 2011, Birmingham, United Kingdom. pp.Article number 6020161, 2011
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hal-00138878v1  Article dans une revue
Cyril ButtayHervé MorelBruno AllardPierre LefrancOlivier BrevetModel Requirements for Simulation of Low-Voltage MOSFET in Automotive Applications
IEEE Transactions on Power Electronics, Institute of Electrical and Electronics Engineers, 2006, 21 (3), pp.613-624. <10.1109/TPEL.2006.872383>
hal-00140094v1  Article dans une revue
Xuefang Lin-ShiJean-Marie RétifBruno AllardHervé MorelNon-linear control design for a boost converter using bond graphs
Proceedings of the Institution of Mechanical Engineers, Part I: Journal of Systems and Control Engineering, SAGE Publications, 2002, 216 (I1), pp.1-11
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hal-00874465v1  Article dans une revue
Amandine MassonWissam SabbahRaphaël RivaCyril ButtayStephane Azzopardi et al.  Die attach using silver sintering. Practical implementation and analysis
European Journal of Electrical Engineering, Lavoisier, 2013, 16 (3-4), pp.293-305. <10.3166/ejee.16.293-305>
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hal-00672440v1  Article dans une revue
Cyril ButtayChristophe RaynaudHervé MorelGabriel CivracMarie-Laure Locatelli et al.  Thermal stability of silicon-carbide power diodes
IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2012, 59 (3), pp.761-769. <10.1109/TED.2011.2181390>
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hal-00140095v1  Article dans une revue
Nouri MassmoudiDjébé M'BaïriBruno AllardHervé MorelOn the validity of the standard SPICE model of the diode for simulation in power electronics
IEEE Transactions on Industrial Electronics, Institute of Electrical and Electronics Engineers, 2001, 48 (4), pp.864-867
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hal-00672244v1  Article dans une revue
Bassem MouawadMaher SoueidanDamien FabrègueCyril ButtayBruno Allard et al.  Application of the Spark Plasma Sintering Technique to Low-Temperature Copper Bonding
IEEE Transactions on Components and Packaging Technologies, Institute of Electrical and Electronics Engineers, 2012, 2 (4), pp.553 - 560. <10.1109/TCPMT.2012.2186453>
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hal-00539180v1  Article dans une revue
Kaiçar AmmousHervé MorelAnis AmmousAnalysis of Power Switching Losses Accounting Probe Modeling
IEEE Transactions on Instrumentation and Measurement, Institute of Electrical and Electronics Engineers, 2010, 59 (12), pp.3218 - 3226. <10.1109/TIM.2010.2047302>
hal-00579353v1  Article dans une revue
Tarek Ben SalahY. LahbibHervé MorelModelling, analysis, and experimental study of SiC JFET body diode
European Physical Journal: Applied Physics, EDP Sciences, 2011, 53 (1), pp.Article Number: 10301. <10.1051/epjap/2010100172>
hal-00597432v1  Article dans une revue
Cyril ButtayDominique PlansonBruno AllardDominique BergognePascal Bevilacqua et al.  State of the art of high temperature power electronics
Materials Science and Engineering: B, Elsevier, 2011, 176 (4), pp.283-288. <10.1016/j.mseb.2010.10.003>