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hal-01067989v1
Communication dans un congrès
Lionel Vincent, Edith Beigne, Laurent Alacoque, Suzanne Lesecq, Catherine Bour et al. A Fully Integrated 32 nm MultiProbe for Dynamic PVT Measurements within Complex Digital SoC VARI: International Workshop on CMOS Variability, May 2011, Grenoble, France. 2011, 2nd International Workshop on CMOS Variability |
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hal-01067982v1
Communication dans un congrès
Lionel Vincent, Philippe Maurine, Edith Beigne, Suzanne Lesecq, Julien Mottin. Temperature and Fast Voltage On-Chip Monitoring using Low-Cost Digital Sensors VARI: Workshop on CMOS Variability, Sep 2013, Karlsruhe, Germany. 2013, 4th International Workshop on CMOS Variability |
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lirmm-01421006v1
Communication dans un congrès
Yeter Akgul, Diego Puschini, Suzanne Lesecq, Edith Beigne, Pascal Benoit et al. Methodology for Power Mode selection in FD-SOI circuits with DVFS and Dynamic Body Biasing PATMOS: Power and Timing Modeling, Optimization and Simulation, Sep 2013, Karlsruhe, Germany. 23rd International Workshop on Power and Timing Modeling, Optimization and Simulation, pp.199-206, 2013, <10.1109/PATMOS.2013.6662174> |
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cea-01519116v1
Communication dans un congrès
Suzanne Lesecq, J Foucault, M Correvon, H Heck, J Barrett et al. INSPEX: design and integration of a portable/wearable smart spatial exploration system DATE'17 conference - Design, Automation and Test in Europe, Mar 2017, Lausanne, Switzerland. 2017, <https://www.date-conference.com/> |
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hal-00763136v1
Communication dans un congrès
Carolina Albea, Diego Puschini, Suzanne Lesecq, Yeter Akgul. Advanced coupled voltage-frequency control for power efficient DVFS management 38th Annual Conference of the IEEE Industrial Electronics Society, Oct 2012, Montréal, Canada. pp.99, 2012 |
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lirmm-01096015v1
Article dans une revue
Lionel Vincent, Edith Beigné, Suzanne Lesecq, Julien Mottin, David Coriat et al. Dynamic Variability Monitoring Using Statistical Tests for Energy Efficient Adaptive Architectures IEEE Transactions on Circuits and Systems Part 1 Fundamental Theory and Applications, Institute of Electrical and Electronics Engineers (IEEE), 2014, Part I: Regular Papers, 61 (6), pp.1741-1754. <10.1109/TCSI.2013.2290850> |
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