 |
|
|
||
|---|---|---|
|
hal-00007942v1
Communication dans un congrès
F. Vargas, M. Nicolaidis, B. Courtois. Quiescent current monitoring to improve the reliability of electronic systems in space radiation environments 1993, IEEE Comput. Soc. Press, Los Alamitos, CA, USA, pp.596-600, 1993, <10.1109/ICCD.1993.393307> |
||
|
hal-00013764v1
Communication dans un congrès
M. Nicolaidis. Time redundancy based soft-error tolerance to rescue nanometer technologies Proceedings-17th-IEEE-VLSI-Test-Symposium-Cat.-No.PR00146, 1999, Dana Point, CA, United States. IEEE Comput. Soc, Los Alamitos, CA, USA, pp.86-94, 1999, <10.1109/VTEST.1999.766651> |
||
|
hal-00013937v1
Communication dans un congrès
F. Vargas, M. Nicolaidis. SEU-tolerant SRAM design based on current monitoring Digest-of-Papers.-The-Twenty-Fourth-International-Symposium-on-Fault-Tolerant-Computing-Cat.-No.94CH3441-3. 1994:, 1994, Austin, TX, United States. IEEE Comput. Soc. Press, Los Alamitos, CA, USA, pp.106-15, 1994, <10.1109/FTCS.1994.315652> |
||
|
hal-00013997v1
Communication dans un congrès
F. Vargas, M. Nicolaidis, B. Hamdi. Quiescent current estimation based on quality requirements Digest-of-Papers.-Eleventh-Annual-1993-IEEE-VLSI-Test-Symposium-Cat.-No.93TH0537-1, 1993, Atlantic City, NJ, United States. IEEE Comput. Soc. Press, Los Alamitos, CA, USA, pp.33-9, 1993, <10.1109/VTEST.1993.313311> |
||
|
hal-00013741v1
Communication dans un congrès
M. Nicolaidis. IP for embedded robustness Proceedings-2002-Design,-Automation-and-Test-in-Europe-Conference-and-Exhibition, 2002, Paris, France. IEEE Comput. Soc, Los Alamitos, CA, USA, pp.240-1, 2002, <10.1109/DATE.2002.998277> |
||
|
hal-00013753v1
Communication dans un congrès
M. Nicolaidis, N. Zaidan, T. Calin, D. Bied-Charreton. ISIS: a fail-safe interface realised in smart power technology Proceedings-6th-IEEE-International-On-Line-Testing-Workshop-Cat.-No.PR00646, 2000, Palma de Mallorca, Spain. IEEE Comput. Soc, Los Alamitos, CA, USA, pp.191-7, 2000 |
||
|
hal-00013754v1
Communication dans un congrès
L. Anghel, M. Nicolaidis, I. Alzaher-Noufal. Self-checking circuits versus realistic faults in very deep submicron Proceedings-18th-IEEE-VLSI-Test-Symposium, 2000, Montreal, Que., Canada. IEEE Comput. Soc, Los Alamitos, CA, USA, pp.55-63, 2000, <10.1109/VTEST.2000.843827> |
||
|
hal-00008235v1
Article dans une revue
F. Faccio, K. Kloukinas, A. Marchioro, T. Calin, J. Cosculluela et al. Single event effects in static and dynamic registers in a 0.25 mu m CMOS technology IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 1999, Dec. 1999, Volume: 46, Issue: 6, pp.1434-1439. <10.1109/23.819104> |
||
|
|
||
