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		Pertinence Auteur A→Z Auteur Z→A Titre A→Z Titre Z→A Date de publication croissante Date de publication décroissante Date de dépôt croissante Date de dépôt décroissante 30 résultats par page 50 résultats par page 100 résultats par page Pour les 26 documents Exporter XML-TEI BibTeX EndNote CSV PDF Export avancé... Syndication RSS ATOM
	lirmm-01272986v1 Article dans une revue Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel et al. Design for Test and Diagnosis of Power Switches Journal of Circuits, Systems, and Computers, World Scientific Publishing, 2016, 25 (3), pp.1640013. <10.1142/S0218126616400132>
	lirmm-01248596v1 Communication dans un congrès Yuanqing Cheng, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard et al. Power supply noise-aware workload assignments for homogeneous 3D MPSoCs with thermal consideration ASP-DAC: Asia and South Pacific Design Automation Conference, Jan 2014, Singapore, Singapore. pp.544-549, 2014, Design Automation Conference (ASP-DAC), 2014 19th Asia and South Pacific. <10.1109/ASPDAC.2014.6742948>
	lirmm-01248598v1 Communication dans un congrès Imran Wali, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard et al. Protecting combinational logic in pipelined microprocessor cores against transient and permanent faults DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. Design and Diagnostics of Electronic Circuits Systems, 17th International Symposium on, pp.223-225, 2014, <10.1109/DDECS.2014.6868794>
	lirmm-01248597v1 Communication dans un congrès Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial et al. A Comprehensive Evaluation of Functional Programs for Power-Aware Test NATW: North Atlantic Test Workshop, May 2014, Johnson City, NY, United States. IEEE, Test Workshop (NATW), 2014 IEEE 23rd North Atlantic, pp.69-72, 2014, <10.1109/NATW.2014.23>
	lirmm-01248617v1 Communication dans un congrès Yuanqing Cheng, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard et al. A novel method to mitigate TSV electromigration for 3D ICs ISVLSI: IEEE Computer Society Annual Symposium on VLSI, Aug 2013, Natal, Brazil. pp.121-126, 2013, <10.1109/ISVLSI.2013.6654633>
	tel-01259002v1 HDR Luigi Dilillo. Test and Reliability of Electronic Circuits in Natural and Radiative Environment Electronics. Université de Montpellier, 2015
	lirmm-00805140v1 Communication dans un congrès Leonardo Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial et al. Test Solution for Data Retention Faults in Low-Power SRAMs EDA Association. DATE: Design, Automation and Test in Europe, Mar 2013, Grenoble, France. Design, Automation & Test in Europe Conference & Exhibition, pp.442-447, 2013, <http://www.date-conference.com/>. <10.7873/DATE.2013.099>
	lirmm-00805143v1 Communication dans un congrès Leonardo Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial et al. Low-power SRAMs Power Mode Control Logic: Failure Analysis and Test Solutions ITC'2012: International Test Conference, Nov 2012, Anaheim, CA, United States. IEEE, pp.1-10, 2012, <http://www.itctestweek.org/>. <10.1109/TEST.2012.6401578>
	lirmm-00805389v1 Communication dans un congrès Paolo Bernardi, Mauricio De Carvalho, Ernesto Sanchez, Matteo Sonza Reorda, Alberto Bosio et al. Peak Power Estimation: A Case Study on CPU Cores IEEE Asian Test Symposium, Nov 2012, Niigata, Japan. IEEE, pp.167-172, 2012, <http://aries3a.cse.kyutech.ac.jp/~ats12/>. <10.1109/ATS.2012.58>
	lirmm-00818984v1 Communication dans un congrès Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel. Why and How Controlling Power Consumption During Test: A Survey ATS: Asian Test Symposium, Nov 2012, Niigata, Japan. Test Symposium (ATS), 2012 IEEE 21st Asian, pp. 221-226, 2012, <http://aries3a.cse.kyutech.ac.jp/~ats12/>. <10.1109/ATS.2012.30>
	lirmm-00818977v1 Communication dans un congrès Leonardo Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial et al. On the Reuse of Read and Write Assist Circuits to Improve Test Efficiency in Low-Power SRAMs ITC: International Test conference, Sep 2013, Anaheim, CA, United States. pp.1-10, 2013, <http://www.itctestweek.org/>. <10.1109/TEST.2013.6651927>
	lirmm-01457424v1 Communication dans un congrès Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Leonardo B. Zordan. An effective BIST architecture for power-gating mechanisms in low-power SRAMs ISQED: International Symposium on Quality Electronic Design, Mar 2016, Santa Clara, CA, United States. IEEE, 17th International Symposium on Quality Electronic Design, pp.185-191, 2016, <http://www.isqed.org/English/Archives/2016/>. <10.1109/ISQED.2016.7479198>
	lirmm-01248590v1 Communication dans un congrès Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri-Sanial, Arnaud Virazel et al. Test and diagnosis of power switches DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. Design and Diagnostics of Electronic Circuits Systems, 17th International Symposium on, pp.213-218, 2014, <10.1109/DDECS.2014.6868792>
	lirmm-00805123v1 Communication dans un congrès Leonardo Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch et al. Failure Analysis and Test Solutions for Low-Power SRAMs ATS: Asian Test Symposium, Nov 2011, New Delhi, India. 20th IEEE Asian Test Symposium, pp.459-460, 2011, <http://www.ecs.umass.edu/ece/ats11/>. <10.1109/ATS.2011.97>
	lirmm-00805366v1 Communication dans un congrès Leonardo Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial et al. A Built-in Scheme for Testing and Repairing Voltage Regulators of Low-Power SRAMs VTS: VLSI Test Symposium, Apr 2013, Berkeley, CA, United States. pp.1-6, 2013, VLSI Test Symposium (VTS), 2013 IEEE 31st. <http://www.tttc-vts.org/public_html/new/2013/index.php>. <10.1109/VTS.2013.6548894>
	lirmm-00805374v1 Communication dans un congrès Leonardo Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial et al. Defect Analysis in Power Mode Control Logic of Low-Power SRAMs ETS: European Test symposium, May 2012, Annecy, France. 17th IEEE European Test Symposium, 2012, <http://ets2012.imag.fr/>. <10.1109/ETS.2012.6233033>
	lirmm-01248599v1 Communication dans un congrès Anu Asokan, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard et al. Path delay test in the presence of multi-aggressor crosstalk, power supply noise and ground bounce DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. IEEE, Design and Diagnostics of Electronic Circuits & Systems, 17th International Symposium on, pp.207-212, 2014, <10.1109/DDECS.2014.6868791>
	lirmm-01248601v1 Communication dans un congrès Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri-Sanial, Arnaud Virazel et al. iBoX — Jitter based Power Supply Noise sensor ETS: European Test Symposium, May 2014, Paderborn, United States. Test Symposium (ETS), 2014 19th IEEE European, pp.1-2, 2014, <10.1109/ETS.2014.6847830>
	lirmm-01272937v1 Communication dans un congrès Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel et al. Exploring the impact of functional test programs re-used for power-aware testing DATE: Design, Automation and Test in Europe, Mar 2015, Grenoble, France. pp.1277-1280, 2015
	lirmm-01272684v1 Communication dans un congrès Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel et al. Design-for-Diagnosis Architecture for Power Switches DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2015, Belgrade, Serbia. pp.43-48, 2015, <10.1109/DDECS.2015.18>
	lirmm-00805339v1 Communication dans un congrès Alessio Griffoni, Jeroen Van Duivenbode, Dimitri Linten, Eddy Simoen, Paolo Rech et al. Neutron-Induced Failure in Super-Junction, IGBT, and SiC Power Devices RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. IEEE, pp.226-231, 2011, <http://www.radecs2011.org/>. <10.1109/RADECS.2011.6131395>
	lirmm-00806774v1 Article dans une revue Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel. Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2013, 21 (5), pp.958-970. <10.1109/TVLSI.2012.2197427>
	lirmm-01255754v1 Article dans une revue Aida Todri-Sanial, Sandip Kundu, Patrick Girard, Alberto Bosio, Luigi Dilillo et al. Globally Constrained Locally Optimized 3-D Power Delivery Networks IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2014, 22 (10), pp.2131-2144. <10.1109/TVLSI.2013.2283800>
	lirmm-00805039v1 Article dans une revue Alessio Griffoni, Jeroen Van Duivenbode, Dimitri Linten, Eddy Simoen, Paolo Rech et al. Neutron-Induced Failure in Silicon IGBTs, Silicon Super-Junction and SiC MOSFETs IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2012, 59 (4), pp.866-871. <10.1109/TNS.2011.2180924>
	lirmm-00934937v1 Article dans une revue Paolo Bernardi, Mauricio De Carvalho, Ernesto Sanchez, Matteo Sonza Reorda, Alberto Bosio et al. Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption Journal of Low Power Electronics, American Scientific Publishers, 2013, 9 (2), pp.253-263. <10.1166/jolpe.2013.1259>
	lirmm-01238443v1 Article dans une revue Leonardo Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel et al. On the Test and Mitigation of Malfunctions in Low-Power SRAMs Journal of Electronic Testing, Springer Verlag, 2014, 30 (5), pp.611-627. <http://link.springer.com/article/10.1007%2Fs10836-014-5479-z>. <10.1007/s10836-014-5479-z>
		Pertinence Auteur A→Z Auteur Z→A Titre A→Z Titre Z→A Date de publication croissante Date de publication décroissante Date de dépôt croissante Date de dépôt décroissante 30 résultats par page 50 résultats par page 100 résultats par page Pour les 26 documents Exporter XML-TEI BibTeX EndNote CSV PDF Export avancé... Syndication RSS ATOM

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