 |
|
|
||
|---|---|---|
|
lirmm-01248597v1
Communication dans un congrès
Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial et al. A Comprehensive Evaluation of Functional Programs for Power-Aware Test NATW: North Atlantic Test Workshop, May 2014, Johnson City, NY, United States. IEEE, Test Workshop (NATW), 2014 IEEE 23rd North Atlantic, pp.69-72, 2014, <10.1109/NATW.2014.23> |
||
|
lirmm-01446917v1
Communication dans un congrès
Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi et al. Improving the Functional Test Delay Fault Coverage: A Microprocessor Case Study ISVLSI: IEEE Computer Society Annual Symposium on VLSI, Jul 2016, Pittsburgh, PA, United States. IEEE, VLSI (ISVLSI), 2016 IEEE Computer Society Annual Symposium on, pp.731-736, 2016, <10.1109/ISVLSI.2016.42 > |
||
|
lirmm-01457396v1
Communication dans un congrès
Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi et al. An effective approach for functional test programs compaction DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2016, Kosice, Slovakia. IEEE, 19th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2016, <http://ddecs2016.fiit.stuba.sk/DDECS_2016/>. <10.1109/DDECS.2016.7482466> |
||
|
lirmm-01272937v1
Communication dans un congrès
Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel et al. Exploring the impact of functional test programs re-used for power-aware testing DATE: Design, Automation and Test in Europe, Mar 2015, Grenoble, France. pp.1277-1280, 2015 |
||
|
|
||
