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hal-00937775v1
Article dans une revue
Alexandre Boyer, Sonia Ben Dhia, Binhong Li, Nestor Berbel, Raul Fernandez-Garcia. Experimental Investigations into the Effects of Electrical Stress on Electromagnetic Emission from Integrated Circuits IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2014, 56 (1), pp. 44-50. <10.1109/TEMC.2013.2272195> |
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hal-00936086v1
Article dans une revue
Alexandre Boyer, Sonia Ben Dhia, Binhong Li, Christophe Lemoine, Bertrand Vrignon. Prediction of Long-Term Immunity of a Phase-Locked Loop Journal of Electronic Testing, Springer Verlag, 2012, 28 (6), pp.791-802. <10.1007/s10836-012-5335-y> |
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