EM Injection: Fault Model and Locality

Sébastien Ordas (1) , Ludovic Guillaume-Sage (1) , Philippe Maurine (2, 1)

1 SmartIES - Smart Integrated Electronic Systems
2 CEA-LETI - Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information

EM injection recently emerged as an effective medium for fault injection. This paper presents an analysis of the IC susceptibility to EM pulses. It highlights that faults produced by EM pulse injection are not timing faults but correspond to a different model which is presented in this paper. This model also allows to explain experimental results introduced in former communications.

Domaines: Micro et nanotechnologies/Microélectronique

Sébastien Ordas, Ludovic Guillaume-Sage, Philippe Maurine. EM Injection: Fault Model and Locality. FDTC: Fault Diagnosis and Tolerance in Cryptography, Sep 2015, Saint Malo, France. pp.3-13, ⟨10.1109/FDTC.2015.9⟩. ⟨lirmm-01319078⟩