A Comprehensive Evaluation of Functional Programs for Power-Aware Test

Aymen Touati (1) , Alberto Bosio (1) , Luigi Dilillo (1) , Patrick Girard (1) , Aida Todri-Sanial (2) , Arnaud Virazel (1) , Paolo Bernardi (3)

1 TEST - Test and dEpendability of microelectronic integrated SysTems
2 SmartIES - Smart Integrated Electronic Systems
3 Dipartimento di Elettronica

This paper presents an evaluation framework for functional programs. Programs are evaluated w.r.t. functional and structural metrics. The goal is to verify if the targeted functional programs can be re-used for verification and test purposes.

Mots clés: ATPG; Functional and Structural test; Power Aware Test; Switches; Power demand; Observability; Measurement; Microprocessors; Correlation; Circuit faults; Structural metrics; Functional metrics; Functional program; Power-aware test; Integrated circuit testing; Power consumption; Comprehensive evaluation framework

Domaines: Micro et nanotechnologies/Microélectronique

Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. A Comprehensive Evaluation of Functional Programs for Power-Aware Test. NATW: North Atlantic Test Workshop, May 2014, Johnson City, NY, United States. pp.69-72, ⟨10.1109/NATW.2014.23⟩. ⟨lirmm-01248597⟩