Comparison of open and resistive-open defect test conditions in SRAM address decoders

Luigi Dilillo (1) , Patrick Girard (1) , Serge Pravossoudovitch (1) , Arnaud Virazel (1) , Simone Borri (2) , Magali Bastian Hage-Hassan (2)

1 SysMIC - Conception et Test de Systèmes MICroélectroniques
2 INFINEON - SOPHIA - Infineon Technologies France

This paper presents a comparative analysis of open (ADOF: Address Decoder Open Fault) and resistive open defects in address decoders of embedded-SRAMs. Such defects are the primary target of this study because they are notoriously hard-to-detect faults. In particular, we consider dynamic defects which may appear in the transistor parallel plane of address decoders. From this study, we show that test conditions required for ADOFs testing (sensitization and observation) can be partially used also for resistive open defect testing.

Mots clés: March tests; SRAM; Address decoders; dynamic fault; open fault; Resistive-open defect

Domaines: Electronique

Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, et al.. Comparison of open and resistive-open defect test conditions in SRAM address decoders. ATS: Asian Test Symposium, Nov 2003, Xian, China. pp.250-255, ⟨10.1109/ATS.2003.1250818⟩. ⟨lirmm-01238821⟩