Cross-Layer Early Reliability Evaluation for the Computing cOntinuum

Stefano Di Carlo (1) , Alessandro Vallero , Dirnitris Gizopoulos (2) , Giorgio Di Natale (3)

1 Polito - Politecnico di Torino = Polytechnic of Turin
2 Department of Informatics
3 SysMIC - Conception et Test de Systèmes MICroélectroniques

Advanced multifunctional computing systems realized in forthcoming technologies hold the promise of a significant increase of the computational capability that will offer end-users ever improving services and functionalities (e.g., next generation mobile devices, cloud services, etc.). However, the same path that is leading technologies toward these remarkable achievements is also making electronic devices increasingly unreliable, posing a threat to our society that is depending on the ICT in every aspect of human activities. Reliability of electronic systems is therefore a key challenge for the whole ICT technology and must be guaranteed without penalizing or slowing down the characteristics of the final products. CLERECO EU FP7 (GA No. 611404) research project addresses early accurate reliability evaluation and efficient exploitation of reliability at different design phases, since these aspects are two of the most important and challenging tasks toward this goal.

Mots clés: Reliability; Embedded systems; High performance computing

Domaines: Micro et nanotechnologies/Microélectronique

Stefano Di Carlo, Alessandro Vallero, Dirnitris Gizopoulos, Giorgio Di Natale. Cross-Layer Early Reliability Evaluation for the Computing cOntinuum. DSD: Digital System Design, Aug 2014, Verona, Italy. pp.199-205, ⟨10.1109/DSD.2014.65⟩. ⟨lirmm-01234117⟩