Atom-Probe Field-Ion Microscopy Investigation of CMSX-4 Ni-Base Superalloy Laser Beam Welds

S. Babu , S. David , J. Vitek , M. Miller

CMSX-4 superalloy laser beam welds were investigated by transmission electron microscopy and atom probe field-ion microscopy (APFIM). The weld microstructure consisted of fine (10- to 50-nm) irregularly shaped γ' precipitates (0.65 to 0.75 volume fraction) within the γ matrix. APFIM compositions of the γ and γ' phases were found to be different from those in the base metal. Concentration profiles across the γ and γ' phases showed extensive variations of Cr, Co and Al concentrations as a function of distance within the γ phase. Calculated lattice misfits near the γ interface in the welds are positive values compared to the negative values for base metal.

Domaines: Articles anciens

S. Babu, S. David, J. Vitek, M. Miller. Atom-Probe Field-Ion Microscopy Investigation of CMSX-4 Ni-Base Superalloy Laser Beam Welds. Journal de Physique IV Proceedings, 1996, 06 (C5), pp.C5-253-C5-258. ⟨10.1051/jp4:1996541⟩. ⟨jpa-00254420⟩