Substructure formation during Cu2o single crystal creep

E. Fries , A. Audouard , T. Bretheau

Cuprous oxide single crystals Cu2O have been deformed from 2 % to 50 % in high temperature compression. The stress was parallel to < 100 > and < 110 >. X-ray Berg-Barrett topography showed the occurence of lattice rotations around two axes in the former case and around one axis in the latter case. Creep substructures, also investigated by chemical etch pitting, were different in both cases : 1) When the stress was parallel to < 100 ) a dense structure with the same features all over the sample in the early stage of the transient creep gradually turned to a well defined equiaxed cell structure in the steady state creep. 2) When the stress was parallel to < 110 > a quite different structure with different features in different parts of the sample in the transient creep turned to a uniform biaxed cell structure with cell boundaries parallel to the < 100 > directions in the steady state creep. A strong correlation was observed between substructure and local deformation within the compression specimen.

Mots clés: compressive strength; copper compounds; creep; crystal microstructure; etching; plastic deformation; X ray diffraction examination of microstructure; Cu sub 2 O single crystal creep; compression; lattice rotations; chemical etch pitting; X ray study; creep substructures

Domaines: Articles anciens

E. Fries, A. Audouard, T. Bretheau. Substructure formation during Cu2o single crystal creep. Revue de Physique Appliquée, 1978, 13 (10), pp.489-493. ⟨10.1051/rphysap:019780013010048900⟩. ⟨jpa-00244479⟩