SURFACE EXAFS AND XANES STUDIES OF S/Ni (110) AND S/Ni (111)

T. Ohta , Y. Kitajima , P. Stefan , M. Shek Stefan , N. Kosugi , H. Kuroda

S K-edge SEXAFS were measured on c(2x2)S/Ni(110) and S/Ni(111) by monitoring the S KLL Auger intensity as a function of photon energy and polarization direction. Analysis of the data from c(2x2)S/Ni(110) gave results that a sulfur atom is located on a hollow site with R(S-top layer Ni) of (2.31±0.02) Å and R(S-bottom Ni) of (2.19±0.03) Å. These results are in close agreement with the recent analysis of LEED. From the preliminary SEXAFS work on p(2x2)S/Ni (111), S-nearest neighbor Ni bond distance was determined to be 2.20±0.04 Å.

Domaines: Articles anciens

T. Ohta, Y. Kitajima, P. Stefan, M. Shek Stefan, N. Kosugi, et al.. SURFACE EXAFS AND XANES STUDIES OF S/Ni (110) AND S/Ni (111). Journal de Physique Colloques, 1986, 47 (C8), pp.C8-503-C8-508. ⟨10.1051/jphyscol:1986894⟩. ⟨jpa-00226225⟩