Skip to Main content Skip to Navigation
Journal articles

QUANTIFICATION OF INTERCONNECTED MICROSTRUCTURES BY FIM

Abstract : The physical properties of two-phase materials are largely determined by the morphology of the microstructure. With materials containing isolated precipitates, the microstructure can be fully defined by the size, shape, and number density of the particles. However, in systems in which both phases are interconnected, a quantitative description of the morphology is much more difficult to make. This paper points out some possible approaches to obtaining quantitative parameters to describe these more complex morphologies using field ion microscopy.
Document type :
Journal articles
Complete list of metadatas

Cited literature [1 references]  Display  Hide  Download

https://hal.archives-ouvertes.fr/jpa-00224426
Contributor : Archives Journal de Physique <>
Submitted on : Sunday, January 1, 1984 - 8:00:00 AM
Last modification on : Sunday, January 1, 1984 - 8:00:00 AM
Long-term archiving on: : Friday, April 30, 2010 - 9:11:37 PM

File

ajp-jphyscol198445C945.pdf
Explicit agreement for this submission

Identifiers

Collections

AJP

Citation

P. Camus, W. Soffa, S. Brenner, M. Miller. QUANTIFICATION OF INTERCONNECTED MICROSTRUCTURES BY FIM. Journal de Physique Colloques, 1984, 45 (C9), pp.C9-265-C6-268. ⟨10.1051/jphyscol:1984945⟩. ⟨jpa-00224426⟩

Share

Metrics

Record views

83

Files downloads

104