QUANTIFICATION OF INTERCONNECTED MICROSTRUCTURES BY FIM

P. Camus , W. Soffa , S. Brenner , M. Miller

The physical properties of two-phase materials are largely determined by the morphology of the microstructure. With materials containing isolated precipitates, the microstructure can be fully defined by the size, shape, and number density of the particles. However, in systems in which both phases are interconnected, a quantitative description of the morphology is much more difficult to make. This paper points out some possible approaches to obtaining quantitative parameters to describe these more complex morphologies using field ion microscopy.

Domaines: Articles anciens

P. Camus, W. Soffa, S. Brenner, M. Miller. QUANTIFICATION OF INTERCONNECTED MICROSTRUCTURES BY FIM. Journal de Physique Colloques, 1984, 45 (C9), pp.C9-265-C6-268. ⟨10.1051/jphyscol:1984945⟩. ⟨jpa-00224426⟩