DIRECT OBSERVATION OF CRYSTALLOGRAPHICAL CHANGES AT 10 K CAUSED BY THE APPLICATION OF VARYING STRESSES TO Nb3Sn WIRES

W. Goldacker , R. Flükiger

X-ray diffraction measurements of Nb3Sn mono- and rnultifilamentary tapes have been performed in the temperature range 5 ≤ T ≤ 300 K under variable axial stress by means of a newly constructed device. The changes of the stress-induced crystallographical modification of the A15 phase have been observed as a function of applied strain ε.

Domaines: Articles anciens

W. Goldacker, R. Flükiger. DIRECT OBSERVATION OF CRYSTALLOGRAPHICAL CHANGES AT 10 K CAUSED BY THE APPLICATION OF VARYING STRESSES TO Nb3Sn WIRES. Journal de Physique Colloques, 1984, 45 (C1), pp.C1-387-C1-390. ⟨10.1051/jphyscol:1984178⟩. ⟨jpa-00223734⟩