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Chapitre D'ouvrage Année : 2011

From Simple Management of Defects to Knowledge Discovery to Optimize Maintenance

Résumé

Whatever the field in which it appears, a defect carries information by the simple fact that it exists, but also by the characteristics of the detected incident (i.e. the problem) and of the applied protocol to resolve it (i.e. the solution). The capitalization of this information is essential to achieve goals such as assistance in corrective actions for future defects and prevention of their emergence. In this paper, we propose to take advantage of this information by modeling a defect on which we will rely on. This model makes it possible to define the grouping criteria of defects that were solved in the past. These groups are the cornerstone of the corrective and preventive processes for new defects.
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Dates et versions

hal-03761356 , version 1 (26-08-2022)

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Citer

Grégory Claude, Marc Gabriel Boyer, Gaël Durand, Florence Sèdes. From Simple Management of Defects to Knowledge Discovery to Optimize Maintenance. Özyer, Tansel; Kianmehr, Keivan; Tan, Mehmet. Recent Trends in Information Reuse and Integration, Springer-Verlag, pp.115-141, 2011, 978-3-7091-0738-6. ⟨10.1007/978-3-7091-0738-6_6⟩. ⟨hal-03761356⟩
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