Elucidation of the Density of States for Polycrystalline Silicon Vertical Thin-Film Transistors

Peng Zhang (1) , Emmanuel Jacques (2) , Regis Rogel (2) , Laurent Pichon (2) , Olivier Bonnaud (2)

1 NJUPT - Nanjing University of Posts and Telecommunications [Nanjing]
2 IETR - Institut d'Électronique et des Technologies du numéRique

The polycrystalline silicon vertical thin-film transistors (TFTs) with different active layer thicknesses of 150 and 300 nm were fabricated by a five-mask process and electrically characterized. The vertical TFT with 150-nm active layer thickness shows comprehensive advantages over its counterpartwith 300-nm active layer, especiallywith a higher ON/OFF current ratio I-ON/I-OFF of more than 10(6) and higher field-effectmobility, excluding the access resistance effect. The electrical parameters were analyzed by the density of states (DOS) calculation, and smallerDOS is deduced for the device with 150-nm active layer for the same energy level. The detailed elucidation of the DOS was analyzed by introducing the intrinsic mobility and the grain boundary barrier height at the flat-band state, which gives the detailed expressions for the DOS. Polycrystalline silicon lateral TFT was also introduced to verify this evaluationmethod.

Mots clés: Access resistance; density of states (DOS); intrinsic mobility; polycrystalline silicon; threshold voltage; vertical thin-film transistors (TFTs); Access resistance

Domaines: Sciences de l'ingénieur [physics]

Peng Zhang, Emmanuel Jacques, Regis Rogel, Laurent Pichon, Olivier Bonnaud. Elucidation of the Density of States for Polycrystalline Silicon Vertical Thin-Film Transistors. IEEE Transactions on Electron Devices, 2022, 69 (6), pp.3175-3180. ⟨10.1109/TED.2022.3167938⟩. ⟨hal-03690764⟩