Artefacts in scanning thermal microscopy: nanometre-scale roughess and oxide films down to the native thickness

Eloïse Guen (1) , N.J. Kaur (2) , Petr Klapetek (3) , Ravish Rajkumar (2) , Gordon Mills (2) , Philipp Dobson (2) , Jonathan Weaver (2) , Pierre-Olivier Chapuis (1) , Séverine Gomès (1)

1 CETHIL - Centre d'Energétique et de Thermique de Lyon
2 University of Glasgow
3 Czech Metrology Institute

Domaines: Thermique [physics.class-ph]

Eloïse Guen, N.J. Kaur, Petr Klapetek, Ravish Rajkumar, Gordon Mills, et al.. Artefacts in scanning thermal microscopy: nanometre-scale roughess and oxide films down to the native thickness. MRS Spring meeting, Symposium "Nanoscal heat transport", Apr 2021, Seattle (remote), United States. ⟨hal-03649750⟩