Notes on the Extraction of Aspect-Independent Parameters of Chipless RFID Tags

Zeshan Ali (1, 2) , Etienne Perret (1, 2)

1 LCIS - Laboratoire de Conception et d'Intégration des Systèmes
2 ORSYS - Systèmes Optoélectroniques et Radiofréquences

This paper presents the extraction of aspectindependent parameters for dual-L dipoles based chipless radio frequency (RF) identification (RFID) tags using spectrogram method using single measurement. The implemented spectrogram method is based on a single short-time Fourier transform (STFT) averaging window. The performance of the spectrogram method is compared to the matrix pencil method (MPM). A computational time comparison between the spectrogram method and MPM is presented. Index Terms-Chipless radio frequency (RF) identification (RFID), matrix pencil method (MPM), quality factor, short time Fourier transform (STFT).

Domaines: Traitement du signal et de l'image [eess.SP]

Zeshan Ali, Etienne Perret. Notes on the Extraction of Aspect-Independent Parameters of Chipless RFID Tags. 2021 6th International Conference on Smart and Sustainable Technologies (SpliTech), Sep 2021, Bol and Split, Croatia. ⟨10.23919/SpliTech52315.2021.9566393⟩. ⟨hal-03448431⟩