Microprocessor Error Diagnosis by Trace Monitoring Under Laser Testing

M. Pena-Fernandez (1) , A. Lindoso (2) , L. Entrena (2) , I. Lopes (3, 4) , Vincent Pouget (3, 4)

1 Arquimea Ingenieria
2 UC3M - Universidad Carlos III de Madrid [Madrid]
3 IES - Institut d’Electronique et des Systèmes
4 RADIAC - Radiations et composants

Domaines: Electronique; Micro et nanotechnologies/Microélectronique

M. Pena-Fernandez, A. Lindoso, L. Entrena, I. Lopes, Vincent Pouget. Microprocessor Error Diagnosis by Trace Monitoring Under Laser Testing. IEEE Transactions on Nuclear Science, 2021, 68 (8), pp.1651-1659. ⟨10.1109/TNS.2021.3067554⟩. ⟨hal-03428150⟩