Electro-thermal limitations and device degradation of SiGe HBTs with emphasis on circuit performance (Invited)

Sebastien Fregonese (1) , Mukherjee Chhandak (1) , Holger Rucker (2) , Pascal Chevalier (3) , Gerhard Fischer (2) , Didier Céli (3) , Marina Deng (1) , François Marc (1) , Cristell Maneux (1) , Thomas Zimmer (1)

1 IMS - Laboratoire de l'intégration, du matériau au système
2 IHP - Innovations for High Performance Microelectronics
3 ST-CROLLES - STMicroelectronics [Crolles]

Domaines: Sciences de l'ingénieur [physics]; Micro et nanotechnologies/Microélectronique

Sebastien Fregonese, Mukherjee Chhandak, Holger Rucker, Pascal Chevalier, Gerhard Fischer, et al.. Electro-thermal limitations and device degradation of SiGe HBTs with emphasis on circuit performance (Invited). 2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), Dec 2021, Monterey, United States. ⟨10.1109/BCICTS50416.2021.9682476⟩. ⟨hal-03408053⟩