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Experimental Analysis of the Electromagnetic Instruction Skip Fault Model and Consequences for Software Countermeasures

Abstract : Microcontrollers storing valuable data or using security functions are vulnerable to fault injection attacks. Among the various types of faults, instruction skips induced at runtime proved to be effective against identification routines or encryption algorithms. Until recently, most research works assessed a fault model that consists in a single instruction skip, i.e. the ability to prevent one chosen instruction in a program from being executed. We question this fault model for EM fault injection on experimental basis and report the possibility to induce several consecutive instructions skips. Such an extended fault model proved to be effective against a duplication-based software countermeasure as our experiments revealed.
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https://hal.archives-ouvertes.fr/hal-03360628
Contributor : Jean-Max Dutertre Connect in order to contact the contributor
Submitted on : Thursday, September 30, 2021 - 9:43:34 PM
Last modification on : Wednesday, March 23, 2022 - 10:18:02 AM
Long-term archiving on: : Friday, December 31, 2021 - 9:09:38 PM

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  • HAL Id : hal-03360628, version 1

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Jean-Max Dutertre, Alexandre Menu, Olivier Potin, Jean-Baptiste Rigaud, Jean-Luc Danger. Experimental Analysis of the Electromagnetic Instruction Skip Fault Model and Consequences for Software Countermeasures. Microelectronics Reliability, Elsevier, 2021. ⟨hal-03360628⟩

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