A multiscale topographical analysis based on morphological information: the HEVC multiscale decomposition

Tarek Eseholi (1) , François-Xavier Coudoux (1, 2, 3) , Patrick Corlay (2, 1, 3) , Rahmad Sadli (1) , Maxence Bigerelle (4)

1 IEMN - Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520
2 COMNUM - IEMN - COMmunications NUMériques - IEMN
3 IEMN-DOAE - Institut d’Électronique, de Microélectronique et de Nanotechnologie - Département Opto-Acousto-Électronique - UMR 8520
4 LAMIH - Laboratoire d'Automatique, de Mécanique et d'Informatique industrielles et Humaines - UMR 8201

In this paper, we evaluate the effect of scale analysis as well as the filtering process on the performances of an original compressed-domain classifier in the field of material surface topographies classification. Each surface profile is multiscale analyzed by using a Gaussian Filter analyzing method to be decomposed into three multiscale filtered image types: Low-pass (LP), Band-pass (BP), and High-pass (HP) filtered versions, respectively. The complete set of filtered image data constitutes the collected database. First, the images are lossless compressed using the state-of-the art High-efficiency video coding (HEVC) video coding standard. Then, the Intra-Prediction Modes Histogram (IPHM) feature descriptor is computed directly in the compressed domain from each HEVC compressed image. Finally, we apply the IPHM feature descriptors as an input of a Support Vector Machine (SVM) classifier. SVM is introduced here to strengthen the performances of the proposed classification system thanks to the powerful properties of machine learning tools. We evaluate the proposed solution we called "HEVC Multiscale Decomposition" (HEVC-MD) on a huge database of nearly 42,000 multiscale topographic images. A simple preliminary version of the algorithm reaches an accuracy of 52%. We increase this accuracy to 70% by using the multiscale analysis of the high-frequency range HP filtered image data sets. Finally, we verify that considering only the highest-scale analysis of low-frequency range LP was more appropriate for classifying our six surface topographies with an accuracy of up to 81%. To compare these new topographical descriptors to those conventionally used, SVM is applied on a set of 34 roughness parameters defined on the International Standard GPS ISO 25178 (Geometrical Product Specification), and one obtains accuracies of 38%, 52%, 65%, and 57% respectively for Sa, multiscale Sa, 34 roughness parameters, and multiscale ones. Compared to conventional roughness descriptors, the HEVC-MD descriptors increase surfaces discrimination from 65% to 81%.

Mots clés: mechanical engineering; surface roughness; roughness analysis; high-efficiency video coding (HEVC); texture feature descriptors; texture image classification; support vector machine (SVM)

Domaines: Matériaux; Traitement du signal et de l'image [eess.SP]; Informatique [cs]; Sciences de l'ingénieur [physics]; Intelligence artificielle [cs.AI]; Réseaux et télécommunications [cs.NI]; Electronique

Tarek Eseholi, François-Xavier Coudoux, Patrick Corlay, Rahmad Sadli, Maxence Bigerelle. A multiscale topographical analysis based on morphological information: the HEVC multiscale decomposition. Materials, 2020, 13 (23), pp.5582. ⟨10.3390/ma13235582⟩. ⟨hal-03321552⟩