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Influence of the gate leakage current on the noise performance of MESFETs and MODFETs

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https://hal.archives-ouvertes.fr/hal-03317746
Contributor : Francois Danneville Connect in order to contact the contributor
Submitted on : Saturday, August 7, 2021 - 9:47:02 AM
Last modification on : Tuesday, October 19, 2021 - 6:38:09 PM

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Francois Danneville, G. Dambrine, H. Happy, A. Cappy. Influence of the gate leakage current on the noise performance of MESFETs and MODFETs. 1993 IEEE MTT-S International Microwave Symposium Digest, Jun 1993, Atlanta, United States. pp.373-376 vol.1, ⟨10.1109/mwsym.1993.276800⟩. ⟨hal-03317746⟩

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