Localized surface plasmon resonance of boron- and phosphorus-doped silicon nanocrystals

Christophe Delerue (1, 2) , S. Zhou , Xiaodong Pi (3) , Y. Ding , Y. Jiang , C. Jin , Deren Yang (4) , T. Nozaki

1 PHYSIQUE - IEMN - Physique - IEMN
2 IEMN - Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520
3 State Key Laboratory of Silicon Materials
4 State Key Laboratory of Silicon Materials

Domaines: Matière Condensée [cond-mat]

Christophe Delerue, S. Zhou, Xiaodong Pi, Y. Ding, Y. Jiang, et al.. Localized surface plasmon resonance of boron- and phosphorus-doped silicon nanocrystals. European Materials Research Society Spring Meeting, E-MRS Spring 2015, Symposium H - Nanoparticles in dielectric matrix for electronics and optics: from the fabrication to the devices, May 2015, Lille, France. ⟨hal-03317594⟩