Ring charging of a single silicon dangling bond imaged by noncontact atomic force microscopy

Natalia Turek (1) , S. Godey (1, 2) , D. Deresmes (1, 2) , Thierry Melin (1, 3)

1 IEMN - Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520
2 PCMP - IEMN - Plateforme de Caractérisation Multi-Physiques - IEMN
3 PHYSIQUE - IEMN - Physique - IEMN

Domaines: Sciences de l'ingénieur [physics]

Natalia Turek, S. Godey, D. Deresmes, Thierry Melin. Ring charging of a single silicon dangling bond imaged by noncontact atomic force microscopy. Physical Review B, 2020, 102 (23), ⟨10.1103/PhysRevB.102.235433⟩. ⟨hal-03288778⟩