Comparing analytical and Monte-Carlo-based simulation methods for logic gates SET sensitivity evaluation - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Microelectronics Reliability Année : 2020

Comparing analytical and Monte-Carlo-based simulation methods for logic gates SET sensitivity evaluation

Résumé

This paper presents a discussion related to two different methods used to evaluate logic gate susceptibility considering Single Event Transient faults at the layout level. These methods can be adopted into radiation-hardening-driven optimizations to improve the overall reliability of circuits. The results show that the simulation approach presents a higher accuracy by considering charge-sharing effects. At the same time, the analytical method can provide similar results in a faster manner.
Fichier principal
Vignette du fichier
paper6.pdf (1.76 Mo) Télécharger le fichier
Origine : Fichiers produits par l'(les) auteur(s)

Dates et versions

hal-03187813 , version 1 (01-04-2021)

Identifiants

Citer

R B Schvittz, Y.Q. Aguiar, Frédéric Wrobel, J-L Autran, L. S Rosa, et al.. Comparing analytical and Monte-Carlo-based simulation methods for logic gates SET sensitivity evaluation. Microelectronics Reliability, 2020, 114, ⟨10.1016/j.microrel.2020.113871⟩. ⟨hal-03187813⟩
78 Consultations
117 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More