An approach based on ANFIS and input selection procedure for microwave characterization of dielectric materials

Hakim Sadou (1) , Tarik Hacib (1) , Hulusi Acikgoz (2) , Yann Le Bihan (3) , Olivier Meyer (3) , Mohamed Rachid Mekideche (1)

1 L2EI - Laboratoire d'Electrotechnique et d'Electronique Industrielle, L2EI, [Université Jilel]
2 KTO - Karatay University
3 GeePs - Laboratoire Génie électrique et électronique de Paris

Domaines: Sciences de l'ingénieur [physics]

Hakim Sadou, Tarik Hacib, Hulusi Acikgoz, Yann Le Bihan, Olivier Meyer, et al.. An approach based on ANFIS and input selection procedure for microwave characterization of dielectric materials. COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering, 2018, 37 (2), pp.799-813. ⟨10.1108/COMPEL-05-2017-0208⟩. ⟨hal-03146287⟩