Pixel-wise full-field strain measurements for analysis of strain heterogeneities with regards to the material microstructure

Adrien Berger (1) , Jean-François Witz (1) , Ahmed El Bartali (1) , N Limodin (1) , Mirentxu Dubar (2) , Denis Najjar (1)

1 LaMcube - Laboratoire de Mécanique, Multiphysique, Multiéchelle - UMR 9013
2 LAMIH - Laboratoire d'Automatique, de Mécanique et d'Informatique industrielles et Humaines - UMR 8201

A new optical-based pixel-wise full-field strain measurement method is proposed. This method allows for high spatial resolution quantification of strain heterogeneities. It is based on the production of a fine speckle pattern, the use of a large sensor camera with high magnification lens and a pixel-wise optical flow algorithm. The measured strain localizations are analyzed with regards to the microstructure of a ferritic-pearlitic steel.

Mots clés: Pixel-wise DIC; DISflow; Strain localizations; Microstructure

Domaines: Mécanique des matériaux [physics.class-ph]

Adrien Berger, Jean-François Witz, Ahmed El Bartali, N Limodin, Mirentxu Dubar, et al.. Pixel-wise full-field strain measurements for analysis of strain heterogeneities with regards to the material microstructure. Photomechanics IDICS Conference, Oct 2020, Nantes, France. ⟨hal-03030937⟩