Electrical and electrothermal 2D simulations of a 4H-SiC high voltage current limiting device for serial protection applications - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2000

Electrical and electrothermal 2D simulations of a 4H-SiC high voltage current limiting device for serial protection applications

Résumé

This work presents a novel field for solid state power devices : a 4H-SiC specific device is examined as a current limiting device for serial protection application. The device structure is a vertical power MOSFET like with a existing N channel. Its performances is simulated with ISE TCAD tools. A study of its electrothermal behavior is presented, demonstrating the SiC superiority over silicon with regards to this field.
Fichier principal
Vignette du fichier
paper_ispsd00_us.pdf (1.6 Mo) Télécharger le fichier
Origine : Fichiers produits par l'(les) auteur(s)
Loading...

Dates et versions

hal-02972084 , version 1 (20-10-2020)

Identifiants

Citer

F. Nallet, A. Senes, Dominique Planson, Marie-Laure Locatelli, J.P. Chante, et al.. Electrical and electrothermal 2D simulations of a 4H-SiC high voltage current limiting device for serial protection applications. 12th International Symposium on Power Semiconductor Devices & ICs. Proceedings, May 2000, Toulouse, France. pp.287-290, ⟨10.1109/ISPSD.2000.856827⟩. ⟨hal-02972084⟩
23 Consultations
55 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More