Evaluating edge loss in the reflectance measurement of translucent materials
Résumé
In many commercial instruments for measuring reflectance, the area illuminated on the measured object is identical to the area from which light is collected. This configuration is suitable for strongly scattering materials such as paper, but issues arise with translucent materials, because a portion of the incident light spreads around the illuminated area by subsurface transport and escapes the detection system. This phenomenon, referred to as edge loss, yields erroneous, underestimated reflectance measurements. In the case of colored and opalescent materials, the impact of edge loss on the measured reflectance varies with the wavelength, which is a significant issue for spectrophotometer and colorimeter users. In the present study, we investigate the edge-loss phenomenon with an emphasis on human skin measurement. In particular, we use a mathematical model to estimate the PSF of translucent materials, relying on the diffusion approximation of the radiative transfer theory, to predict edge-loss measurement error. We use this model to discuss the suitability of several commercial spectrophotometers to accurately measure the translucent materials of various optical properties and show that not all devices can adapt to all translucent materials.
Origine : Fichiers produits par l'(les) auteur(s)