Automated Test Flow: the Present and the Future, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2019. ,
Reduced-code static linearity test of SAR ADCs using a built-in incremental converter, Int. Symposium on On-Line Testing And Robust System Design (IOLTS), pp.29-34, 2018. ,
URL : https://hal.archives-ouvertes.fr/hal-01922304
Reduced-code static linearity test of splitcapacitor SAR ADCs using an embedded incremental ?? converter, IEEE Trans. on Device and Materials Reliability, pp.37-45, 2019. ,
URL : https://hal.archives-ouvertes.fr/hal-01989117
Reduced-Code Techniques for On-Chip Static Linearity Test of SAR ADCs, 2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC), pp.263-268, 2019. ,
URL : https://hal.archives-ouvertes.fr/hal-02165220
On-chip reduced-code static linearity test of Vcm-based switching SAR ADCs using an incremental analogto-digital converter, European Test Symposium, p.2020 ,
Mixed-signal BIST computation offloading using IEEE 1687, 22nd IEEE European Test Symposium, pp.1-2, 2017. ,
URL : https://hal.archives-ouvertes.fr/hal-01702762
Fuzzy logic based objective image quality assessment with fpga implementation, Journal of Systems Architecture, vol.82, pp.24-36, 2018. ,
URL : https://hal.archives-ouvertes.fr/hal-01744677
Defective pixel analysis for image sensor online diagnostic and self-healing, IEEE 37th VLSI Test Symposium (VTS), pp.1-6, 2019. ,
URL : https://hal.archives-ouvertes.fr/hal-02614553
Detection, Location and Concealment of Defective Pixels in Image Sensors, IEEE Transactions on Emerging Topics in Computing ,
URL : https://hal.archives-ouvertes.fr/hal-02948273
Robustness of Timing In-Situ Monitors for AVS Management, IEEE International Reliability for Physics of Semiconductors (IRPS), 2016. ,
URL : https://hal.archives-ouvertes.fr/hal-01474794
Aging Investigation of Digital Circuit using In Situ Monitors, IEEE International Integrated Reliability Workshop, 2019. ,
Run-Time Aging Prediction Through Machine-Learning, IEEE International Test Conference, 2018. ,
Don't Forget to Lock your SIB: Hiding Instruments using P1687, IEEE International Test Conference, 2013. ,
Fine-Grained Access Management in Reconfigurable Scan Networks, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.34, pp.934-947, 2015. ,
A Comprehensive Approach to a Trusted Test Infrastructure, IEEE Internation Verification and Security Workshop, 2019. ,
URL : https://hal.archives-ouvertes.fr/lirmm-02306980
Dynamic Authentication-Based Secure Access to Test Infrastructure, IEEE European Test Symposium (ETS), 2020. ,
URL : https://hal.archives-ouvertes.fr/hal-02887467